OUR QUALITY POLICY

“We will consistently provide products and services that exceed the expectations of our customers. We will actively pursue quality improvements through continuous improvements of our processes that enable each employee to do their job right, the first time and every time to deliver defect free products and services at the most competitive price”.

 

Quality Assurance and Control  (QA & QC)

Our facilities and Integrated Management Systems are certified with ISO 9001:2008 (Quality Management Systems); ISO 14001:2004 (Environmental Management Systems) and OHSAS 18001:2007 (Safety Management Systems) and our cells are calibrated by ISE Fraunhofer**

**DEUTSCHER KALIBRIERDIENST:

The PV Cells need to meet very high international standards and therefore investments have been made in QA & QC Program and Equipment.

Our QA program covers the following areas:

1. Incoming Materials

The quality of wafers, chemicals and process gases are maintained in order to produce high quality PV Cells. The program for Quality Management is based on two practices. Firstly it ensures Purchase agreements with reputed companies and that too for an extended period. Secondly it ensures strict quality check of incoming raw materials.

2. In line Quality Process Controls

The Production line is equipped to monitor the quality of production/process at all stages so that remedial measures can be taken, should any deviation is noticed. The planned production lines have the latest sorting and checking equipment

3. Post Production and Offline QA Programs

An extensive QA department has been established with a well equipped Lab to ensure thorough testing of finished products and a detailed analysis of the products across various parameters.
The QA team is headed by a Senior Manager who reports to the Management directly and is at par with the Production Manager.
The following Equipments are in place for Online and Offline testing and Quality management.

4. Cell Testing, EL Measurement & Sorting

The cells are directly transported by a belt from the output of the fast firing furnace to the cell tester.
During testing the wafers are illuminated by a flash light sun simulator with electric controlled flash lamp. Electroluminescence Measurements also doing 100%. Sorting is carried out in up to 32 bins. The definition of the classes is freely programmable.
For each cell the full IV-Characteristics is measured. The IV-characteristic is corrected with respect to lamp intensity and cell temperature. From the IV Characteristics all important parameters like:

1. Short circuit current
2. Open circuit voltage
3. Power at maximal power point
4. Fill factor is computed and stored
5. Reversible Current measurements at -10V & -12V

The machine is equipped with an automatic optical inspection system checking the metallization pattern and the colour of the cells.
The electrical power output can be combined with optical properties for determining the class. As an example the following classes can be defined:

1. Optical quality A combined with 10 power classes
2. Optical quality B combined with the same power classes
3. Optical reject (2x)
4. Electrical reject (2x)

Inline Measurement Equipment

1. Measurement of Sheet Resistivity

After the diffusion process, the inspection tool is used for characterisation of the sheet resistivity of the diffused wafer.

2. ARC-Control

Camera system for quality control of SiN-ARC
The camera system is used for characterization of the SiN-antireflection- coating. The system measures every wafer. In case of an out of spec measurement, an alarm is generated.

3. Front Side Inspection (Screen Printing)

The print camera at the print inspection after front side metallization is for print quality inspection. The system is capable of determining the finger width. The system measures every wafer. In case of an out of spec measurement, an alarm is generated.

4. Cell Class

Camera system for optical classification of finished solar cells into four different colours.
The `vision-system’ for inspection of front grid and colour classification measures every wafer.
The classification criteria can be geometrical data (completeness of corners and edges, exact format, etc.), surface defects (print quality, stains, and chipping defects) and colour classification (colour code, stains). This works in a way, that no additional handling and manual sorting has to be carried out

 

Certificate of EMS
Certificate of EMS
Certificate of OHSAS
Certificate of OHSAS
Certificate of QMS
Certificate of QMS